Crop Science -- Index by Author (Nov 2004; Volume 44, Number 6)

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Index by Author: Nov 2004; 44 (6) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Ahmadzadeh, A. [Abstract] [Full Text]; Ahmadzadeh, A. [Abstract] [Full Text]; Ali, S.M. [Full Text]; Andrews, D.J. [Full Text]; Andrews, D.J. [Full Text]; Arthur, Lane [Full Text]
B: Backman, Paul A. [Abstract] [Full Text]; Badeck, F. W. [Abstract] [Full Text]; Baenziger, P.S [Full Text]; Baltensperger, A.A. [Full Text]; Baltensperger, D.D. [Full Text]; Baltensperger, David D. [Abstract] [Full Text]; Bang, Sang W. [Abstract] [Full Text]; Bänziger, Marianne [Abstract] [Full Text]; Bayaa, B. [Full Text]; Bayaa, B. [Full Text]; Beachell, Henry [Abstract] [Full Text]; Bearb, K. [Full Text]; Beavis, William D. [Full Text]; Benitez, Eduardo R. [Abstract] [Full Text]; Berberich, S. A. [Abstract] [Full Text]; Betrán, F. J. [Abstract] [Full Text]; Beuselinck, P.R. [Full Text]; Bhatnagar, S. [Abstract] [Full Text]; Bollich, P.K. [Full Text]; Boman, Randal K. [Full Text]; Boquet, Donald J. [Full Text]; Braden, Chris A. [Abstract] [Full Text]; Brede, A.D [Full Text]; Brede, A.D. [Full Text]; Brede, A.D. [Full Text]; Brede, A.D. [Full Text]; Brede, A.D. [Full Text]; Brede, A.D. [Full Text]; Breitenbeck, Gary A. [Full Text]; Brown, D.A. [Full Text]; Brown, J. [Full Text]; Brown, Steven M. [Full Text]; Brummer, E. Charles [Full Text]; Buhler, Douglas D. [Full Text]
C: Cambron, S.E. [Full Text]; Cao, M. X. [Abstract] [Full Text]; Carlson, G.R. [Full Text]; Carver, B.F. [Full Text]; Cattivelli, L. [Abstract] [Full Text]; Chase, K. [Abstract] [Full Text]; Chatterton, N. Jerry [Abstract] [Full Text]; Chee, P.W. [Full Text]; Chee, Peng W. [Abstract] [Full Text]; Chee, Peng W. [Full Text]; Chu, Q.R. [Full Text]; Clayton, G. [Abstract] [Full Text]; Cooper, Mark [Abstract] [Full Text]; Cooper, Mark [Full Text]; Cooper, Mark [Abstract] [Full Text]; Coulman, Bruce [Abstract] [Full Text]; Crossa, Jose [Abstract] [Full Text]; Curley, J. [Abstract] [Full Text]
D: Davis, J.B. [Full Text]; de Rocquigny, Pamela J. [Abstract] [Full Text]; DeLacy, Ian [Abstract] [Full Text]; Dhungana, Prabhakar [Abstract] [Full Text]; Di Fonzo, N. [Abstract] [Full Text]; Dobb, J. [Abstract] [Full Text]; Dubcovsky, Jorge [Full Text]; Dubuc, J. P. [Abstract] [Full Text]; Dudley, Lynn M. [Abstract] [Full Text]; Duguid, Scott D. [Abstract] [Full Text]; Dunand, R.T. [Full Text]; Dunn, D. J. [Abstract] [Full Text]; Duvick, Donald N. [Abstract] [Full Text]; Dweikat, I.M [Full Text]; Dweikat, I.M. [Full Text]; Dyck, J. A. [Abstract] [Full Text]
E: Eaton, T. D. [Abstract] [Full Text]; Eckhoff, J.L. [Full Text]; Edwards, L.H. [Full Text]; Ejeta, Gebisa [Abstract] [Full Text]; El-Ashkar, F. [Full Text]; El-Ashkar, F. [Full Text]; El-Hassan, H. [Full Text]; El-Hassan, H. [Full Text]; Elwinger, Gerald F. [Abstract] [Full Text]; Entz, Martin H. [Abstract] [Full Text]; Erskine, W. [Full Text]; Erskine, W. [Full Text]
F: Fehr, Walter R. [Abstract] [Full Text]; Feng, Jie [Abstract] [Full Text]; Feng, Lizhi [Full Text]; Feng, Lizhi [Abstract] [Full Text]; Fernández-Martínez, J.M. [Full Text]; Friesen, T. L. [Abstract] [Full Text]; Frisch, M. [Abstract] [Full Text]; Fu, Yong-Bi [Abstract] [Full Text]; Funatsuki, Hideyuki [Abstract] [Full Text]
G: Gannaway, John R. [Full Text]; Gentile, Roberta M. [Abstract] [Full Text]; Gethi, James G. [Abstract] [Full Text]; Gingle, Alan R. [Full Text]; Goodman, Major M. [Full Text]; Goodman, Robert M. [Abstract] [Full Text]; Gosselin, T. [Full Text]; Graham, Geoff [Full Text]; Graybosch, R.A. [Full Text]; Grenier, Cécile [Abstract] [Full Text]; Grey, W.E. [Full Text]; Groth, D.E. [Full Text]; Gunathilagaraj, K. [Abstract] [Full Text]
H: Hallauer, A.R. [Full Text]; Halsey, M. E. [Abstract] [Full Text]; Hardebeck, Glenn A. [Abstract] [Full Text]; Havey, Michael J. [Full Text]; Hein, Gary [Abstract] [Full Text]; Hirasawa, Tadashi [Abstract] [Full Text]; Hoisington, D. A. [Abstract] [Full Text]; Hopkins, A. A. [Abstract] [Full Text]; Horak, M. J. [Abstract] [Full Text]; Horton, Howard [Abstract] [Full Text]; Huang, J. Q. [Abstract] [Full Text]; Hucl, P. [Abstract] [Full Text]; Hughes, Geoff R. [Abstract] [Full Text]; Hulke, Brent S. [Abstract] [Full Text]; Hunt, T. [Abstract] [Full Text]; Hybner, R. [Full Text]
J: Jahn, Molly M. [Full Text]; Jensen, K.B. [Full Text]; Jensen, Kevin B. [Abstract] [Full Text]; Jensen, S. G. [Abstract] [Full Text]; Johnson, Blaine [Abstract] [Full Text]; Johnston, William J. [Abstract] [Full Text]; Jung, G. [Abstract] [Full Text]; Jung, H. G. [Abstract] [Full Text]
K: Kadah, N. [Full Text]; Kadah, N. [Full Text]; Kadirvel, P. [Abstract] [Full Text]; Kaneko, Yukio [Abstract] [Full Text]; Karim, B.A. [Full Text]; Karim, B.A. [Full Text]; Kasperbauer, M. J. [Abstract] [Full Text]; Kephart, K.D. [Full Text]; Knap, H.T. [Full Text]; Krall, J.M. [Full Text]; Kujawski, Jennifer [Abstract] [Full Text]; Kushnak, G.D. [Full Text]
L: Lamkey, K.R. [Full Text]; Lanning, S.P. [Full Text]; Lark, K. G. [Abstract] [Full Text]; Larson, S.R. [Full Text]; Lee, E. A. [Abstract] [Full Text]; Lee, E. A. [Abstract] [Full Text]; Lewellen, R.T. [Full Text]; Lidestri, O. [Abstract] [Full Text]; Linscombe, S.D. [Full Text]; Livingston, David P., III [Abstract] [Full Text]; Long, Jennifer K. [Abstract] [Full Text]; Loughrin, J. H. [Abstract] [Full Text]; Lu, J. A. [Abstract] [Full Text]; Lukaszewski, A. J. [Abstract] [Full Text]; Lyon, Drew J. [Abstract] [Full Text]
M: Ma, Hong [Abstract] [Full Text]; Maheswaran, M. [Abstract] [Full Text]; Malinowski, D. P. [Abstract] [Full Text]; Maman, Nouri [Abstract] [Full Text]; Martienssen, Robert A. [Full Text]; Mason, Stephen C. [Abstract] [Full Text]; Matson, A.L. [Full Text]; Matsuzawa, Yasuo [Abstract] [Full Text]; Matus-Cádiz, M. A. [Abstract] [Full Text]; May, O. Lloyd [Abstract] [Full Text]; May, O. Lloyd [Full Text]; May, O.L. [Full Text]; McCouch, Susan R. [Abstract] [Full Text]; Melchinger, A. E. [Abstract] [Full Text]; Metzger, R. J. [Abstract] [Full Text]; Metzger, R.J. [Full Text]; Miltner, Eric D. [Abstract] [Full Text]; Morgan, G.H. [Full Text]; Mornhinweg, D.W. [Full Text]; Moroz, D. L. [Abstract] [Full Text]; Morrison, L. A. [Abstract] [Full Text]; Mujeeb-Kazi, A. [Abstract] [Full Text]; Murphy, J. Paul [Abstract] [Full Text]; Murray, L. W. [Abstract] [Full Text]
N: Nachtman, J. [Full Text]; Naruoka, Yukiko [Abstract] [Full Text]; Nash, D. [Full Text]; Nass, H. [Abstract] [Full Text]; Naylor, Rosamond L. [Full Text]; Nelson, Lenis A. [Abstract] [Full Text]; Nelson, Rebecca J. [Full Text]
O: Ohm, H.W. [Full Text]; Ookawa, Taiichiro [Abstract] [Full Text]; Orf, J. H. [Abstract] [Full Text]; Osborn, Thomas C. [Abstract] [Full Text]; Osborn, Thomas C. [Abstract] [Full Text]; Ozias-Akins, Peggy [Abstract] [Full Text]
P: Palmer, R.G. [Full Text]; Parrott, Wayne [Full Text]; Paterson, Andrew H. [Full Text]; Patterson, F.L. [Full Text]; Patton, Aaron J. [Abstract] [Full Text]; Peel, M.D. [Full Text]; Peel, Michael D. [Abstract] [Full Text]; Phan, Anh T. [Abstract] [Full Text]; Podlich, Dean [Abstract] [Full Text]; Podlich, Dean W. [Full Text]; Polewicz, Hieronim [Abstract] [Full Text]; Polewicz, Hieronim [Abstract] [Full Text]; Porter, D.R. [Full Text]
Q: Quick, J. [Abstract] [Full Text]; Quijada, Pablo A. [Abstract] [Full Text]; Quijada, Pablo A. [Abstract] [Full Text]
R: Rajewski, J.F. [Full Text]; Rajewski, J.F. [Full Text]; Ratcliffe, R.H. [Full Text]; Ray, I. M. [Abstract] [Full Text]; Reicher, Zachary J. [Abstract] [Full Text]; Reif, J. C. [Abstract] [Full Text]; Rich, Patrick J. [Abstract] [Full Text]; Richards, Ken W. [Abstract] [Full Text]; Rinehart, Geoffrey J. [Abstract] [Full Text]; Rizza, F. [Abstract] [Full Text]; Rodgers, C.A. [Full Text]; Rooney, L. W. [Abstract] [Full Text]; Ross, J. B. [Abstract] [Full Text]; Russell, W. Ken [Abstract] [Full Text]
S: Sakhanokho, H. [Full Text]; Sakhanokho, Hamidou F. [Abstract] [Full Text]; Sanderson, Matt A. [Abstract] [Full Text]; Sanderson, Matt A. [Abstract] [Full Text]; Sarker, A. [Full Text]; Sarker, A. [Full Text]; Sayama, Ayumi [Abstract] [Full Text]; Sebesta, E. [Full Text]; Segovia-Lerma, A. [Abstract] [Full Text]; Seip, L. [Full Text]; Sha, X. [Full Text]; Sheckell, P. A. [Abstract] [Full Text]; Siles, M. M. [Abstract] [Full Text]; Simón, M. R. [Abstract] [Full Text]; Skinner, R. Howard [Abstract] [Full Text]; Smith, C. W. [Abstract] [Full Text]; Smith, C. Wayne [Full Text]; Smith, E.L. [Full Text]; Smith, J. Stephen C. [Abstract] [Full Text]; Smith, Margaret E. [Abstract] [Full Text]; Smith, Margaret E. [Abstract] [Full Text]; Smith, Oscar S. [Abstract] [Full Text]; Smith, Oscar S. [Full Text]; Somers, D. A. [Abstract] [Full Text]; Soundararajan, R. P. [Abstract] [Full Text]; Stahnke, Gwen K. [Abstract] [Full Text]; Stanca, A. M. [Abstract] [Full Text]; Stevens, W. E. [Abstract] [Full Text]; Stewart, J. McD. [Abstract] [Full Text]; Stombaugh, S. K. [Abstract] [Full Text]; Stougaard, R.N. [Full Text]; Struik, P. C. [Abstract] [Full Text]
T: Taba, Suketoshi [Abstract] [Full Text]; Takahashi, Ryoji [Abstract] [Full Text]; Talbert, L. [Abstract] [Full Text]; Talbert, L.E. [Full Text]; Thro, Ann Marie [Full Text]; Tollenaar, M. [Abstract] [Full Text]; Tollenaar, M. [Abstract] [Full Text]; Tompkins, D. K. [Abstract] [Full Text]; Tracy, Benjamin F. [Abstract] [Full Text]; Trethowan, Richard [Abstract] [Full Text]
U: Udall, Joshua A. [Full Text]; Udall, Joshua A. [Abstract] [Full Text]; Udall, Joshua A. [Abstract] [Full Text]
V: Vallad, Gary E. [Abstract] [Full Text]; van der Grinten, Martin [Abstract] [Full Text]; van Ginkel, Maarten [Abstract] [Full Text]; van Ginkel, Maarten [Abstract] [Full Text]; Van Vleck, L. Dale [Abstract] [Full Text]; Velasco, L. [Full Text]; Vogelzang, Robert [Abstract] [Full Text]; Vogelzang, Robert D. [Abstract] [Full Text]
W: Waldron, B.L. [Full Text]; Waldron, Blair L. [Abstract] [Full Text]; Walker, D. W. [Abstract] [Full Text]; Wan, C. Z. [Abstract] [Full Text]; Wang, Jiankang [Abstract] [Full Text]; Wang, Jiankang [Abstract] [Full Text]; Warburton, M. L. [Abstract] [Full Text]; Webster, J.A. [Full Text]; Wei, Z. M. [Abstract] [Full Text]; Welke, Grace A. [Abstract] [Full Text]; White, L.M. [Full Text]; White, P.R. [Full Text]; Wichman, D.M. [Full Text]; Williams, C.E. [Full Text]; Williams, David W. [Abstract] [Full Text]; Williamson, R. C. [Abstract] [Full Text]; Wiltse, C. C. [Abstract] [Full Text]; Worland, A. J. [Abstract] [Full Text]
X: Xia, X. C. [Abstract] [Full Text]; Xu, S. S. [Abstract] [Full Text]; Xu, Yunbi [Abstract] [Full Text]
Y: Yao, Q. H. [Abstract] [Full Text]; Ye, Guoyou [Abstract] [Full Text]; Yeung, Edward C. [Full Text]
Z: Zhang, H. [Abstract] [Full Text]; Zhang, J. F. [Abstract] [Full Text]

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