Crop Science -- Index by Author (May 2004; Volume 44, Number 3)

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Index by Author: May 2004; 44 (3) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Abebe, Tilahun [Abstract] [Full Text]; Afonin, Alexandr [Full Text]; Akhtouch, B. [Full Text]; Al-Khatib, K. [Full Text]; Al-Maskri, A. [Abstract] [Full Text]; Anderson, J.A. [Full Text]; Andrews, D.J. [Full Text]; Arelli, P. R. [Abstract] [Full Text]; Artelt, B. J. [Abstract] [Full Text]
B: Bade, D.H. [Full Text]; Baianu, I. C. [Abstract] [Full Text]; Balota, Maria [Abstract] [Full Text]; Baltensperger, David D. [Abstract] [Full Text]; Barcaccia, G. [Abstract] [Full Text]; Bean, S. R. [Abstract] [Full Text]; Beck, Erwin [Abstract] [Full Text]; Beck, Erwin [Abstract] [Full Text]; Becker, Heiko C. [Abstract] [Full Text]; Bennett, J. Brandon [Abstract] [Full Text]; Berdahl, John D. [Abstract] [Full Text]; Betrán, F.J. [Full Text]; Betrán, F.J. [Full Text]; Betrán, F.J. [Full Text]; Betrán, F.J. [Full Text]; Betrán, F.J. [Full Text]; Betrán, F.J. [Full Text]; Betrán, F.J. [Full Text]; Bibby, Bo Martin [Abstract] [Full Text]; Bigelow, Cale A. [Abstract] [Full Text]; Biradar, S. K. [Abstract] [Full Text]; Blomquist, L. K. [Abstract] [Full Text]; Blumenthal, Jürg M. [Abstract] [Full Text]; Bockholt, A. [Full Text]; Bockholt, A. [Full Text]; Bockholt, A. [Full Text]; Bockholt, A. [Full Text]; Bockholt, A. [Full Text]; Bockholt, A. [Full Text]; Bockholt, A. [Full Text]; Boerma, H. Roger [Abstract] [Full Text]; Bowman, Daniel C. [Abstract] [Full Text]; Branham, Bruce E. [Abstract] [Full Text]; Brede, A.D. [Full Text]; Bughrara, Suleiman S. [Abstract] [Full Text]; Burgener, Paul A. [Abstract] [Full Text]; Butrón, A. [Abstract] [Full Text]
C: Carlson, S. R. [Abstract] [Full Text]; Casler, M. D. [Abstract] [Full Text]; Cassel, D. Keith [Abstract] [Full Text]; Chand, R. [Abstract] [Full Text]; Chowdbury, P. K. [Abstract] [Full Text]; Chung, O.K. [Full Text]; Cianzio, S. R. [Abstract] [Full Text]; Cianzio, Silvia R. [Abstract] [Full Text]; Clayshulte, S.R. [Full Text]; Clifford, B.L. [Full Text]; Coffelt, T.A. [Full Text]; Cogan, N. O. I. [Abstract] [Full Text]; Coleman, S.W. [Full Text]; Collins, M. [Abstract] [Full Text]; Conner, R.L. [Full Text]; Conner, R.L. [Full Text]; Conner, R.L. [Full Text]; Cooper, R.L. [Full Text]; Cristescu, Simona [Abstract] [Full Text]
D: Darrah, Larry L. [Abstract] [Full Text]; Deen, William [Abstract] [Full Text]; Delate, K. [Abstract] [Full Text]; Devine, T.E. [Full Text]; Diers, B. W. [Abstract] [Full Text]; Diers, B. W. [Abstract] [Full Text]; Diers, B. W. [Abstract] [Full Text]; Domínguez, J. [Full Text]; Dorrance, A.E. [Full Text]; Dougherty, C. T. [Abstract] [Full Text]; Duppong, L. M. [Abstract] [Full Text]; Dweikat, I.M. [Full Text]
E: Elias, E.M. [Full Text]; Elias, E.M. [Full Text]
F: Faris, Justin D. [Abstract] [Full Text]; Fehr, W. R. [Abstract] [Full Text]; Fehr, Walter R. [Abstract] [Full Text]; Fermanian, Thomas W. [Abstract] [Full Text]; Fernández-Martínez, J. [Full Text]; Finnerty, Steven L. [Abstract] [Full Text]; Fioritto, R.J. [Full Text]; Fojt, F., III [Full Text]; Fojt, F., III [Full Text]; Fojt, F., III [Full Text]; Fojt, F., III [Full Text]; Fojt, F., III [Full Text]; Fojt, F., III [Full Text]; Fojt, F., III [Full Text]; Forster, J. W. [Abstract] [Full Text]; Friesen, Timothy L. [Abstract] [Full Text]; Fritz, A. K. [Abstract] [Full Text]; Funnell, D. L. [Abstract] [Full Text]
G: Garcia, E. [Abstract] [Full Text]; Gepts, P. [Abstract] [Full Text]; Glover, K. D. [Abstract] [Full Text]; Graybosch, R. A. [Abstract] [Full Text]; Greene, Stephanie L. [Full Text]; Gregg, P. C. [Abstract] [Full Text]; Grichar, W.J., Jr. [Full Text]; Gulya, T.J. [Full Text]
H: Ha, Bo-Keun [Abstract] [Full Text]; Haen, Karri M. [Abstract] [Full Text]; Haley, S.D. [Full Text]; Hammond, J.J. [Full Text]; Hammond, J.J. [Full Text]; Han, K. J. [Abstract] [Full Text]; Harren, F. J. M. [Abstract] [Full Text]; Hartman, G. L. [Abstract] [Full Text]; Hartman, G. L. [Abstract] [Full Text]; Harveson, Robert M. [Abstract] [Full Text]; Haunold, A. [Full Text]; Hayward, M. D. [Abstract] [Full Text]; Henning, J. [Full Text]; Hibbard, Bruce E. [Abstract] [Full Text]; Hisano, H. [Abstract] [Full Text]; Hoffman, D. D. [Abstract] [Full Text]; Hömmö, Leena [Abstract] [Full Text]; Horak, M. J. [Abstract] [Full Text]; Horton, R. [Abstract] [Full Text]; Huang, H.C. [Full Text]; Huang, H.C. [Full Text]; Huang, H.C. [Full Text]; Hucl, P. [Abstract] [Full Text]; Hussey, M.A. [Full Text]; Hussey, Richard S. [Abstract] [Full Text]
J: Jaradat, A. A. [Abstract] [Full Text]; Jauhiainen, Lauri [Abstract] [Full Text]; Johnson, G.W. [Full Text]; Johnson, J.J. [Full Text]; Jones, E. S. [Abstract] [Full Text]; Jones, T.A. [Full Text]; Jones, T.A. [Full Text]; Joshi, A. K. [Abstract] [Full Text]
K: Kabelka, E. A. [Abstract] [Full Text]; Kaeppler, Heidi F. [Abstract] [Full Text]; Kami, J. [Abstract] [Full Text]; Kemp, G.A. [Full Text]; Kenny, S. [Full Text]; Kiehn, F.A. [Full Text]; Kiehn, F.A. [Full Text]; Kiehn, F.A. [Full Text]; Klingler, Kimberly A. [Full Text]; Kraus, G. [Abstract] [Full Text]; Kumar, S. [Abstract] [Full Text]
L: Laarhoven, L. J. J. [Abstract] [Full Text]; Lane, R.A. [Full Text]; Larsen, Søren Ugilt [Abstract] [Full Text]; LeRoy, A. R. [Abstract] [Full Text]; Lewellen, R.T. [Full Text]; Li, S. [Abstract] [Full Text]; Liebman, M. [Abstract] [Full Text]; Liu, Weidong [Abstract] [Full Text]; Llorente, C.F. [Full Text]; Lozovaya, V. V. [Abstract] [Full Text]; Lu, Huangjun [Abstract] [Full Text]; Lygin, A. V. [Abstract] [Full Text]; Lyon, Drew J. [Abstract] [Full Text]
M: Mahaffee, W. [Full Text]; Malvar, R. A. [Abstract] [Full Text]; Manthey, F.A. [Full Text]; Manthey, F.A. [Full Text]; Marois, James J. [Abstract] [Full Text]; Marque, V. [Abstract] [Full Text]; Martin, G. S. [Abstract] [Full Text]; Martin, Sheri A. [Abstract] [Full Text]; Martin, T. J. [Abstract] [Full Text]; Marwede, Volker [Abstract] [Full Text]; Matus-Cádiz, M. A. [Abstract] [Full Text]; Mayfield, K. [Full Text]; Mayfield, K. [Full Text]; Mayfield, K. [Full Text]; Mayfield, K. [Full Text]; Mayfield, K. [Full Text]; McCord, Kristen L. [Abstract] [Full Text]; McGrath, J.M. [Full Text]; McMurtrey, J.E., III [Full Text]; McVetty, Peter B. E. [Abstract] [Full Text]; Melero-Vara, J.M. [Full Text]; Mendiola, T. [Full Text]; Miller, J. F. [Abstract] [Full Text]; Miller, J.D. [Full Text]; Miller, J.D. [Full Text]; Miller, J.D. [Full Text]; Miller, J.F. [Full Text]; Miller, J.F. [Full Text]; Miller, J.F. [Full Text]; Miller, J.F. [Full Text]; Möllers, Christian [Abstract] [Full Text]; Mosjidis, Jorge A. [Full Text]; Mozingo, R.W. [Full Text]; Muir, J.P. [Full Text]; Mündel, H.-H. [Full Text]; Mündel, H.-H. [Full Text]; Mündel, H.-H. [Full Text]; Muñoz-Ruz, J. [Full Text]
N: Narra, Siddhartha [Abstract] [Full Text]; Neece, D. J. [Abstract] [Full Text]; Nelson, R. L. [Abstract] [Full Text]; Netondo, Godfrey Wafula [Abstract] [Full Text]; Netondo, Godfrey Wafula [Abstract] [Full Text]; Nielson, D.C. [Full Text]; Nielson, D.C. [Full Text]; Nomura, T. [Abstract] [Full Text]
O: Ocumpaugh, W.R. [Full Text]; Olsen, T.C. [Full Text]; Onyango, John Collins [Abstract] [Full Text]; Onyango, John Collins [Abstract] [Full Text]; Ordás, A. [Abstract] [Full Text]
P: Pallottini, L. [Abstract] [Full Text]; Parrott, W. A. [Abstract] [Full Text]; Paulsen, G. M. [Abstract] [Full Text]; Payne, W. A. [Abstract] [Full Text]; Peairs, F.B. [Full Text]; Pedersen, J. F. [Abstract] [Full Text]; Peel, M.D. [Full Text]; Pemberton, I. J. [Full Text]; Pérez-Vich, B. [Full Text]; Petrich, J. [Abstract] [Full Text]; Phan, A. [Full Text]; Phipps, P.M. [Full Text]; Pietsch, D. [Full Text]; Pietsch, D. [Full Text]; Pinchak, W.E. [Full Text]; Pitman, W.D. [Full Text]
Q: Quick, J.S. [Full Text]
R: Rajeshwari, R. [Abstract] [Full Text]; Rajewski, J.F. [Full Text]; Rasmussen, J.B. [Full Text]; Rasmussen, J.B. [Full Text]; Ray, Ian M. [Abstract] [Full Text]; Read, J.C. [Full Text]; Reddall, A. [Abstract] [Full Text]; Romero, F. [Abstract] [Full Text]; Rooney, L. [Full Text]; Rouquette, F. M., Jr. [Full Text]; Rudolph, J.B. [Full Text]; Russell, W. Ken [Abstract] [Full Text]
S: Sadras, V. O. [Abstract] [Full Text]; Sahramaa, Mia [Abstract] [Full Text]; Saindon, G. [Full Text]; Saindon, G. [Full Text]; Saindon, G. [Full Text]; Sarma, N. P. [Abstract] [Full Text]; Scarth, Rachael [Abstract] [Full Text]; Schierholt, Antje [Abstract] [Full Text]; Schmidt, M. A. [Abstract] [Full Text]; Schnebly, Steven R. [Abstract] [Full Text]; Seabourn, B.W. [Full Text]; Sellman, M.J. [Full Text]; Shahid, M. [Abstract] [Full Text]; Shimamoto, Y. [Abstract] [Full Text]; Singh, R. P. [Abstract] [Full Text]; Skadsen, Ronald W. [Abstract] [Full Text]; Smith, G. R. [Full Text]; Smith, G.R. [Full Text]; Smith, John A. [Abstract] [Full Text]; Smith, K. F. [Abstract] [Full Text]; Smith, Steven E. [Abstract] [Full Text]; Sonti, Ramesh V. [Abstract] [Full Text]; St. Martin, S.K. [Full Text]; Statler, G.D. [Full Text]; Steadman, J. R. [Abstract] [Full Text]; Stewart, Greg [Abstract] [Full Text]; Stromberger, J.A. [Full Text]; Sundaram, R. M. [Abstract] [Full Text]; Swann, C.W. [Full Text]; Swiader, John M. [Abstract] [Full Text]
T: Tang, Jihong [Abstract] [Full Text]; te Lintel Hekkert, S. [Abstract] [Full Text]; Thirumurugan, T. [Abstract] [Full Text]; Tollenaar, Matthijs [Abstract] [Full Text]; Tollenaar, Matthijs [Abstract] [Full Text]; Townsend, S. [Full Text]
V: Valentinuz, Oscar R. [Abstract] [Full Text]; Vandemark, George [Abstract] [Full Text]; Vanzant, E. S. [Abstract] [Full Text]; Vargas, Matthew A. [Abstract] [Full Text]; Veatch, Maren E. [Abstract] [Full Text]; Vecchies, A. C. [Abstract] [Full Text]; Velasco, L. [Full Text]; Velasco, P. [Abstract] [Full Text]; Vergara, Georgina V. [Abstract] [Full Text]; Vick, B.A. [Full Text]; Viraktamath, B. C. [Abstract] [Full Text]; Vishnupriya, M. R. [Abstract] [Full Text]; Voigt, Thomas B. [Abstract] [Full Text]; Vuong, T. D. [Abstract] [Full Text]
W: Wan, Jianmin [Full Text]; Wang, Chunming [Full Text]; Wang, D. [Abstract] [Full Text]; Wang, Tong [Abstract] [Full Text]; Wardyn, Brandon M. [Abstract] [Full Text]; Welke, Grace A. [Abstract] [Full Text]; Wiatrak, Pawel J. [Abstract] [Full Text]; Widholm, J. M. [Abstract] [Full Text]; Wilson, L. J. [Abstract] [Full Text]; Wilson, Robert G. [Abstract] [Full Text]; Wright, David L. [Abstract] [Full Text]
Y: Yamada, T. [Abstract] [Full Text]; Yashitola, J. [Abstract] [Full Text]; Yasui, Hideshi [Full Text]; Yonts, C. Dean [Abstract] [Full Text]; Yoshimura, Atsushi [Full Text]; You, T. [Abstract] [Full Text]; Young, S.A. [Full Text]; Young, S.A. [Full Text]
Z: Zhai, Huqu [Full Text]

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