Crop Science -- Index by Author (Mar 2004; Volume 44, Number 2)

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	Author:		Keyword(s):
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Index by Author: Mar 2004; 44 (2) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Abbate, P. E. [Abstract] [Full Text]; Afonin, Alexandr [Abstract] [Full Text]; Alvernaz, J. [Full Text]; Anand, S.C. [Full Text]; Anderson, Steven R. [Abstract] [Full Text]; Arbelbide, Martin [Abstract] [Full Text]; Arelli, P.R. [Full Text]; Asay, Kay H. [Abstract] [Full Text]
B: Bacon, Robert K. [Full Text]; Baenziger, P. S. [Abstract] [Full Text]; Bailey, M.A. [Full Text]; Baker, S.H. [Full Text]; Baltensperger, D.D. [Full Text]; Bartsch, Michael [Abstract] [Full Text]; Basak, S. L. [Abstract] [Full Text]; Basu, A. [Abstract] [Full Text]; Bednarz, Craig W. [Abstract] [Full Text]; Belanger, F. C. [Abstract] [Full Text]; Beres, B.L. [Full Text]; Beres, B.L. [Full Text]; Bergman, C.J. [Full Text]; Bernardo, Rex [Abstract] [Full Text]; Bernardo, Rex [Abstract] [Full Text]; Blair, M. W. [Abstract] [Full Text]; Boerma, H.R. [Full Text]; Bohn, M. [Abstract] [Full Text]; Bonos, S. [Abstract] [Full Text]; Bonos, Stacy A. [Abstract] [Full Text]; Bormans, C.A. [Full Text]; Bowen, David [Abstract] [Full Text]; Bowman, Daniel C. [Abstract] [Full Text]; Brede, A. Douglas [Abstract] [Full Text]; Brown-Guedira, G.L. [Full Text]; Budak, H. [Abstract] [Full Text]; Burton, J.W. [Full Text]; Byun, Jaehyun [Abstract] [Full Text]
C: Campbell, B. T. [Abstract] [Full Text]; Cantarero, M. G. [Abstract] [Full Text]; Cardina, John [Abstract] [Full Text]; Carlson, G. R. [Abstract] [Full Text]; Carrow, Robert N. [Abstract] [Full Text]; Carter, T.E., Jr. [Full Text]; Carter, T.E., Jr. [Full Text]; Chen, P. [Full Text]; Chen, P. [Full Text]; Chen, Yiwu [Abstract] [Full Text]; Cianzio, Silvia R. [Abstract] [Full Text]; Cianzio, Silvia R. [Abstract] [Full Text]; Clarke, Bruce B. [Abstract] [Full Text]; Clawson, S.M. [Full Text]; Clemente, Tom [Abstract] [Full Text]; Cooper, R.L. [Full Text]; Cooper, R.L. [Full Text]; Cooper, R.L. [Full Text]; Cox, T.S. [Full Text]
D: Dardanelli, J. L. [Abstract] [Full Text]; Das, Modan K. [Abstract] [Full Text]; Davis, R.F. [Full Text]; De, A. [Abstract] [Full Text]; de Córdova, Pascual Fernández [Abstract] [Full Text]; Denny, R.L. [Full Text]; Denny, R.L. [Full Text]; Denny, R.L. [Full Text]; Dorrance, A.E. [Full Text]; Dorrance, A.E. [Full Text]; Dorsch, John A. [Abstract] [Full Text]; Dreisigacker, S. [Abstract] [Full Text]; Dumka, Disha [Abstract] [Full Text]; Duncan, Ronny R. [Abstract] [Full Text]; Duque, M. C. [Abstract] [Full Text]
E: Echenique, María [Abstract] [Full Text]; Ehlke, Nancy J. [Abstract] [Full Text]; El Hassan, H. [Full Text]; El Hassan, H. [Full Text]; Erayman, M. [Abstract] [Full Text]; Erskine, W. [Full Text]; Erskine, W. [Full Text]; Eskridge, K. M. [Abstract] [Full Text]
F: Fagerness, Matthew J. [Abstract] [Full Text]; Fehr, Walter R. [Abstract] [Full Text]; Fehr, Walter R. [Abstract] [Full Text]; Ferriol, María [Abstract] [Full Text]; Fioritto, R.J. [Full Text]; Fioritto, R.J. [Full Text]; Fjellstrom, R.G. [Full Text]; Frickel, G.E. [Full Text]; Fritschi, Felix B. [Abstract] [Full Text]; Fritz, A.K. [Full Text]; Fuentes, Roger G. [Abstract] [Full Text]
G: Gevers, Hans O. [Abstract] [Full Text]; Ghosh, M. [Abstract] [Full Text]; Gibson, Lance R. [Abstract] [Full Text]; Gill, B.S. [Full Text]; Gill, K. S. [Abstract] [Full Text]; Goggi, A. Susana [Abstract] [Full Text]; Gordon, Stuart G. [Abstract] [Full Text]; Graef, George [Abstract] [Full Text]; Graham, Peter H. [Abstract] [Full Text]; Greene, Stephanie L. [Abstract] [Full Text]; Greger, Maria [Abstract] [Full Text]; Grewal, Parwinder S. [Abstract] [Full Text]; Guttieri, M. J. [Abstract] [Full Text]; Guttieri, Mary [Abstract] [Full Text]
H: Habernicht, D. K. [Abstract] [Full Text]; Hain, J. [Full Text]; Hallauer, A.R. [Full Text]; Han, Feng [Abstract] [Full Text]; Henning, J. A. [Abstract] [Full Text]; Hoisington, D. [Abstract] [Full Text]; Hole, D.J. [Full Text]; Horton, Robert [Abstract] [Full Text]; Huang, Bingru [Abstract] [Full Text]; Hummer, K. E. [Abstract] [Full Text]; Hutmacher, Robert B. [Abstract] [Full Text]
J: Jakkula, L.R. [Full Text]; Jiang, Yiwei [Abstract] [Full Text]; Jiang, Zhongchun [Abstract] [Full Text]; Johnson, Douglas A. [Abstract] [Full Text]; Johnson, J. [Full Text]
K: Kadah, N. [Full Text]; Kadah, N. [Full Text]; Karim, B.A. [Full Text]; Karim, B.A. [Full Text]; Kelly, John T. [Full Text]; Kershen, Drew L. [Abstract] [Full Text]; Khanna-Chopra, Renu [Abstract] [Full Text]; Kinney, Anthony [Abstract] [Full Text]; Klingler, Kimberly A. [Abstract] [Full Text]; Knapp, Allen D. [Abstract] [Full Text]; Kraemer, M. [Full Text]; Krall, J.M. [Full Text]; Kubik, Christine [Abstract] [Full Text]
L: Lamkey, K.R. [Full Text]; Lanning, S. P. [Abstract] [Full Text]; Lauer, Joseph G. [Abstract] [Full Text]; Lauer, Michael J. [Abstract] [Full Text]; Lee, G.J. [Full Text]; Lee, S.H. [Full Text]; Lipps, Patrick E. [Abstract] [Full Text]; Liu, Y. L. [Abstract] [Full Text]; Löfstedt, Martina [Abstract] [Full Text]
M: Marchetti, M.A. [Full Text]; Martin, J. M. [Abstract] [Full Text]; Matthies, Inge [Abstract] [Full Text]; Maturano, M. [Abstract] [Full Text]; Maw, Bryan W. [Abstract] [Full Text]; May, O.L. [Full Text]; McClung, A.M. [Full Text]; McIntyre, S.A. [Full Text]; McLean, R. [Abstract] [Full Text]; Mebrahtu, T. [Full Text]; Melchinger, A. E. [Abstract] [Full Text]; Melchiori, R. J. M. [Abstract] [Full Text]; Mendiola, T. [Full Text]; Meyer, R. [Abstract] [Full Text]; Meyer, W. A. [Abstract] [Full Text]; Meyer, William A. [Abstract] [Full Text]; Mian, M.A.R. [Full Text]; Mills, G.R. [Full Text]; Milus, Eugene A. [Full Text]; Moinuddin, [Abstract] [Full Text]; Moser, Lowell E. [Abstract] [Full Text]; Mosjidis, Jorge A. [Abstract] [Full Text]; Munamava, Miriam Rukero [Abstract] [Full Text]; Muñoz, L. C. [Abstract] [Full Text]
N: Nan, Z. B. [Abstract] [Full Text]; Narvel, J.M. [Full Text]; Nelson, L.A. [Full Text]; Nelson, Randall L. [Abstract] [Full Text]; Novitzky, W. [Full Text]; Nuez, Fernando [Abstract] [Full Text]
O: O'Brien, K. M. [Abstract] [Full Text]; Oltmans, Sheilah E. [Abstract] [Full Text]; Orf, J.H. [Full Text]; Orf, J.H. [Full Text]; Orf, J.H. [Full Text]
P: Park, W.D. [Full Text]; Parsons, Charles E. [Full Text]; Pearson, D.C. [Full Text]; Pearson, D.C. [Full Text]; Pedersen, Palle [Abstract] [Full Text]; Peel, Michael D. [Abstract] [Full Text]; Perkovic, S.M. [Full Text]; Perkovic, S.M. [Full Text]; Picó, Belén [Abstract] [Full Text]; Pollak, Linda [Abstract] [Full Text]; Postman, B. [Full Text]; Postman, B. [Full Text]; Powell, W. [Abstract] [Full Text]; Pratt, Richard C. [Abstract] [Full Text]; Purcell, Larry C. [Abstract] [Full Text]
Q: Quesenberry, Kenneth H. [Abstract] [Full Text]
R: Raboy, Victor [Abstract] [Full Text]; Rains, D. William [Abstract] [Full Text]; Real, Daniel [Abstract] [Full Text]; Richmond, Douglas S. [Abstract] [Full Text]; Rickertsen, J.R. [Full Text]; Riggs, R.D. [Full Text]; Riggs, R.D. [Full Text]; Rizza, Marco Dalla [Abstract] [Full Text]; Roberts, Bruce A. [Abstract] [Full Text]; Roca, W. [Abstract] [Full Text]; Roche, D. [Full Text]; Rogis, Carla [Abstract] [Full Text]; Rufty, Thomas W., Jr. [Abstract] [Full Text]; Rupe, J.C. [Full Text]; Rupe, J.C. [Full Text]; Russelle, Michael P. [Abstract] [Full Text]
S: Sadasivaiah, R.S. [Full Text]; Sadasivaiah, R.S. [Full Text]; Sakr, B. [Full Text]; Sakr, B. [Full Text]; Sarker, A. [Full Text]; Sarker, A. [Full Text]; Sato, Shirley [Abstract] [Full Text]; Schoper, John B. [Abstract] [Full Text]; Schweiger, Bruce [Abstract] [Full Text]; Sebastian, Scott A. [Abstract] [Full Text]; Sen, S. K. [Abstract] [Full Text]; Serraj, Rachid [Abstract] [Full Text]; Shannon, J.G. [Full Text]; Sheaffer, Craig C. [Abstract] [Full Text]; Shibles, Richard M. [Abstract] [Full Text]; Sinclair, Thomas R. [Abstract] [Full Text]; Singh, S. [Full Text]; Sleper, D.A. [Full Text]; Smalley, Matthew D. [Abstract] [Full Text]; Smart, Alexander J. [Abstract] [Full Text]; Sneller, C.H. [Full Text]; Sneller, C.H. [Full Text]; Souza, E. J. [Abstract] [Full Text]; Souza, Edward [Abstract] [Full Text]; St. Martin, S.K. [Full Text]; St. Martin, S.K. [Full Text]; Steiner, J. J. [Abstract] [Full Text]; Streck, N. A. [Abstract] [Full Text]; Streit, Leon G. [Abstract] [Full Text]; Stymiest, C. [Full Text]; Suero, E. E. [Abstract] [Full Text]; Sullivan, W. Michael [Abstract] [Full Text]
T: Talbert, L. E. [Abstract] [Full Text]; Taliaferro, Charles M. [Abstract] [Full Text]; Tohme, J. [Abstract] [Full Text]; Travis, Robert L. [Abstract] [Full Text]; Troyer, A. Forrest [Abstract] [Full Text]; Tyler, J.M. [Full Text]
V: Van Ginkel, M. [Abstract] [Full Text]; Vigil, M. [Full Text]; Vogel, Kenneth P. [Abstract] [Full Text]
W: Waldron, Blair L. [Abstract] [Full Text]; Wan, Jianmin [Abstract] [Full Text]; Wang, Chunming [Abstract] [Full Text]; Wang, Y. R. [Abstract] [Full Text]; Warburton, M. L. [Abstract] [Full Text]; Weiss, A. [Abstract] [Full Text]; Welke, Grace A. [Abstract] [Full Text]; White, P.R. [Full Text]; Wilson, R.F. [Full Text]; Wrather, J.A. [Full Text]; Wyse, Donald L. [Abstract] [Full Text]
X: Xing, Aiqiu [Abstract] [Full Text]; Xu, Qingzhang [Abstract] [Full Text]
Y: Yasui, Hideshi [Abstract] [Full Text]; Ye, Xingguo [Abstract] [Full Text]; Yelverton, Fred H. [Abstract] [Full Text]; Yoshimura, Atsushi [Abstract] [Full Text]; Young, L.D. [Full Text]; Young, L.D. [Full Text]; Young, S.A. [Full Text]; Yu, Jianming [Abstract] [Full Text]; Yu, L. [Abstract] [Full Text]
Z: Zhai, Huqu [Abstract] [Full Text]; Zhang, P. [Abstract] [Full Text]

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