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Fig. 1. Sequential path model illustrating interrelationships among various characters contributing to grain yield (DM-1999 dataset). Abbreviations: CD: cob diameter; KL: kernel length; KT: kernel thickness; KW: kernel width; NL: total number of leaves per plant; NE: number of ears per plant; PH: plant height; ED: ear diameter; EL: ear length; NR: number of kernel rows; NKR: number of kernels per row; 100GW: 100-grain weight; TNK: total number of kernels per ear; TGW: total grain weight per ear.
