Fig. 3 Contours showing LOD for simple regression of seedling IT in Synthetic/Opata wheat RILs on each RFLP marker in turn, after removal of resistant lines carrying the Synthetic allele at RFLP marker Xmwg634-4DS, and chi-square contingency test for the same trait coded as binary (R, S). Markers are arrayed in map order with short arms of chromosomes at right. Chromosome lengths reflect numbers of markers, not genetic length. In the upper (LOD) plot, deviation from center line at a marker indicates the parent contributing the allele associated with higher disease
