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Published online 30 July 2007
Published in Crop Sci 47:1416-1425 (2007)
© 2007 Crop Science Society of America
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Genetic Analysis of Indirect Selection for Winter Wheat Grain Yield Using Spectral Reflectance Indices

B. Prasada, B. F. Carvera, M. L. Stoneb, M. A. Babarc, W. R. Rauna and A. R. Klatta,*

a Dep. of Plant and Soil Sciences, 368 Ag Hall, Oklahoma State Univ., Stillwater, OK 74078, USA
b Dep. of Biosystems and Agricultural Engineering, Oklahoma State Univ., Stillwater, OK 74078, USA
c Dep. of Agronomy, Kansas State Univ., Manhattan, KS 66506, USA. This research was partially funded by Oklahoma Agricultural Experiment Station, Oklahoma Wheat Commission, and Oklahoma Wheat Research Foundation


Figure 1
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Figure 1. Linear relationship between grain yield and normalized water index 3 (NWI-3) at three growth stages and averaged over growth stages for Population 1. ** Significant at the 0.01 probability level.

 

Figure 2
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Figure 2. Two-dimensional distributions of coefficients of the first two principal components (PC) obtained by a multivariate analysis of different spectral reflectance indices and grain yield for three experiments. RNDVI, red normalized difference vegetation index; GNDVI, green normalized difference vegetation index; SR, simple ratio; WI, water index; NWI-1, normalized water index 1; NWI-2, normalized water index 2; NWI-3, normalized water index 3; NWI-4, normalized water index 4; YLD, yield.

 





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