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Published online 31 May 2007
Published in Crop Sci 47:961-968 (2007)
© 2007 Crop Science Society of America
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Advancement toward New Spot Blotch Resistant Wheats in South Asia

R. C. Sharma* and E. Duveiller

CIMMYT, South Asia Regional Office, P.O. Box 5186, Kathmandu, Nepal


Figure 1
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Figure 1. Partial map of South Asia showing sites where the Helminthosporium monitoring nursery (HMN) was grown.

 

Figure 2
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Figure 2. Mean area under disease progress curve per day (AUDPC/day) of the 24 wheat genotypes tested in the Helminthosporium monitoring nursery, South Asia, 2003 to 2005. (Refer to Table 1 for names of the genotypes.)

 

Figure 3
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Figure 3. Mean grain yield under fungicide-treated and untreated treatments of the 24 wheat genotypes tested in 35 environments across South Asia. (Refer to Table 1 for names of the genotypes.)

 

Figure 4
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Figure 4. Spot blotch induced reduction in grain yield of the 24 wheat genotypes averaged across 35 sites in South Asia. (Refer to Table 1 for names of the genotypes.)

 

Figure 5
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Figure 5. Genotype and genotype x environment biplot showing a comparison of 24 wheat genotypes with an ideal genotype for the inverse of the area under the disease progress curve per day across 35 environments in South Asia. The environments are hidden (for clarity of the graph) and treated as random samples of the target environments. (Refer to Table 1 for names of the genotypes.)

 

Figure 6
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Figure 6. Genotype and genotype x environment biplot showing a comparison of 24 wheat genotypes with an ideal genotype for grain yield across 35 environments in South Asia. The environments are hidden (for clarity of the graph) and treated as random samples of the target environments. (Refer to Table 1 for name of the genotypes.)

 





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