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Published online 6 February 2007
Published in Crop Sci 47:311-320 (2007)
© 2007 Crop Science Society of America
677 S. Segoe Rd., Madison, WI 53711 USA
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Modeling Additive x Environment and Additive x Additive x Environment Using Genetic Covariances of Relatives of Wheat Genotypes

Juan Burgueñoa, José Crossaa,*, Paul L. Corneliusb, Richard Trethowanc, Graham McLarend and Anitha Krishnamacharid

a Biometrics and Statistics Unit of the Crop Informatics Laboratory (CRIL), International Maize and Wheat Improvement Center (CIMMYT), Apdo. Postal 6-641, México, D.F., México
b Dep. of Plant and Soil Sciences and Dep. of Statistics, Univ. of Kentucky, Lexington, KY 40546-0312, USA
c Plant Breeding Institute, University of Sydney, PMB 11, Camden NSW 2570, Australia
d Biometrics and Bioinformatics Unit of the Crop Informatics Laboratory (CRIL), International Rice Research Institute (IRRI), DAPO Box 7777, Manila, the Philippines


Figure 1
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  		Fig. 1. Biplot of BLUPs of the additive and additive x environment effects from MM1 for grain yield of Data Set 1. Sites are S1 to S10. Lines are 1 to 47. Sister lines are marked in bold: (17, 18), (20, 21, 22), (26, 27), (28, 29), (34, 35, 36, 37, 38, 39, 40), (42, 45, 47).

 

Figure 2
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  		Fig. 2. Biplot of BLUPs of the additive x additive and additive x additive x environment effects from MM1 for grain yield of Data Set 1. Sites are S1 to S10. Lines are 1 to 47. Sister lines are marked in bold: (17, 18), (20, 21, 22), (26, 27), (28, 29), (34, 35, 36, 37, 38, 39, 40), (42, 45, 47).

 




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