Published online 22 January 2007
Published in Crop Sci 47:245-253 (2007)
© 2007 Crop Science Society of America
677 S. Segoe Rd., Madison, WI 53711 USA
Genetic Improvement of Grain Yield and Associated Traits in the Northern China Winter Wheat Region from 1960 to 2000
Y. Zhoua,
Z. H. Hea,b,*,
X. X. Suic,
X. C. Xiaa,
X. K. Zhanga and
G. S. Zhangd
a Crop Science Institute/National Wheat Improvement Center, Chinese Academy of Agricultural Sciences (CAAS), No 12 Zhongguancun South St., Beijing 100081, China
b CIMMYT China Office, C/O CAAS, No 12 Zhongguancun South St., Beijing 100081, China
c Crop Research Institute, Shandong Academy of Agric. Sciences, No 28 Sangyuan Rd., Jinan 250100, Shandong, China
d College of Agronomy, Northwest Sci-Tech Univ. of Agric. and Forestry, Yangling 712100, Shaanxi, China

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Fig. 1. Regression of grain yield on year of release in the four trials. (a) YPT1 in Beijing, (b) YPT2 in Hebei, (c) YPT3 in Shandong, and (d) YPT4 in Henan. * and ** represent significance at the 0.05 and 0.01 probability levels, respectively.
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Copyright © 2007 by the Crop Science Society of America.