Published online 22 January 2007
Published in Crop Sci 47:111-122 (2007)
© 2007 Crop Science Society of America
677 S. Segoe Rd., Madison, WI 53711 USA
QTL Associated with Yield in Three Backcross-Derived Populations of Soybean
P. S. Guzmana,*,
B. W. Diersb,
D. J. Neecec,
S. K. St. Martind,
A. R. LeRoye,
C. R. Grauf,
T. J. Hughesf and
R. L. Nelsonc
a former post-doc research assoc., Univ. of Illinois, Urbana, IL 61801
b Dep. of Crop Sciences, Univ. of Illinois, Urbana, IL 61801
c USDA-ARS, Soybean/Maize Germplasm, Pathology, and Genetics Research Unit, Dep. of Crop Sciences, Univ. of Illinois, Urbana, IL 61801
d Dep. of Horticulture and Crop Science, The Ohio State Univ., Columbus, OH 43210
e Dep. of Agronomy, Purdue Univ., West Lafayette, IN 47907
f Dep. of Plant Pathology, Univ. of Wisconsin, Madison, WI 53706


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Fig. 1. Approximate position of the genetic markers associated with a yield (Yd) quantitative trait loci (QTL) and agronomic traits (M = days to maturity, H = plant height) in the Beeson 80 (Bees), Kenwood (Ken) and Lawrence (Law) populations based on the soybean integrated map (Song et al., 2004). On the right of the linkage groups are markers and citations for previous reports of QTL in the same or near the region where we identified yield QTL.
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Copyright © 2007 by the Crop Science Society of America.