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Published online 23 September 2005
Published in Crop Sci 45:2273-2280 (2005)
© 2005 Crop Science Society of America
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Molecular Mapping and Allelic Relationships of Russian Wheat Aphid–Resistance Genes

X. M. Liua, C. M. Smitha,*, B. R. Friebeb and B. S. Gillb

a Dep. of Entomology
b Wheat Genetics Resource Center and Dept of Plant Pathology, Kansas State Univ., Manhattan, KS 66506



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  		Fig. 1. Comparison of DNA fragments amplified from DNA of euploid, aneuploid, and deletion lines of wheat by using primer pairs (A) GWM44 and (B) GWM111, electrophoresed in a 2% agarose gel. Arrow indicates the characteristic fragments present or absent in the corresponding wheat lines. CS = ‘Chinese Spring’, NT = CS N7DT7A, Dt7DS = CS Dt7DS, 7DS-4,-5,-6 = deletion CS lines del7DS-4(FL0.61), del7DS-5(FL0.36), and del7DS-6(FL0.73), respectively. L100 = 100-bp DNA ladder.

 


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  		Fig. 2. Polymorphic bands (within rectangle) amplified by primer pair GWM 111 from DNA of RWA-resistant sources PI 137739 (Dn1), PI 262660 (Dn2), PI 294994 (Dn5), PI 220127 (Dnx), and PI 243781 (Dn6), electrophoresed in a 2% agarose gel. The top band in each lane, corresponding to the characteristic fragment of CS, is associated with Dn1, Dn2, Dn5, Dnx, and Dn6 (as described in text); L = 100-bp DNA ladder.

 


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  		Fig. 3. (A) Physical and (B) adjusted genetic maps of microsatellite markers Xgwm44, Xgwm111, and the linked RWA-resistance genes (Dn) on wheat chromosome arm 7DS. FL = Relative fraction-length value of the remaining chromosomal arm from the physical breakpoint (indicated as arrow) to the centromere. S, L = short or long chromosome arm.

 




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