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QTL Mapping of Antibiosis Resistance to Common Cutworm (Spodoptera litura Fabricius) in Soybean

^a National Agric. Research Center for Kyushu Okinawa Region, 2421 Suya, Nishigoshi, Kikuchi, Kumamoto 861-1192, Japan
^b Japan International Research Center for Agricultural Science, 1-1 Ohwashi, Tsukuba, Ibaraki 305-8686, Japan

View larger version (14K): [in a new window]   Fig. 1. Logarithm of odds (LOD) scores associated with the standardized insect-growth index (SII) of common cutworm growth on linkage group M, estimated by means of the composite interval mapping method. An LOD score of 3.55 for the QTL detection threshold was associated with a Type I error rate of 5% from a 1000-permutation test.