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Published online 27 May 2005
Published in Crop Sci 45:1241-1248 (2005)
© 2005 Crop Science Society of America
677 S. Segoe Rd., Madison, WI 53711 USA
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Localization of a Quantitative Trait Locus Providing Brown Stem Rot Resistance in the Soybean Cultivar Bell

M. E. Patzoldta, C. R. Graub, P. A. Stephensc, N. C. Kurtzweilb, S. R. Carlsona and B. W. Diersa,*

a Dep. of Crop Sciences, Univ. of Illinois, 1101 W. Peabody Dr., Urbana, IL 61801
b Dep. of Plant Pathology, Univ. of Wisconsin, 1630 Linden Dr., Madison, WI 53706
c Pioneer Hi-Bred Int'l, Inc., Princeton, IL 61356



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  		Fig. 1. Diagrammatic representation of the regions segregating on linkage group J (LG J) for the near isogenic line (NIL) populations developed by crossing the cultivars Bell and Colfax. Genetic distances between markers in centimorgans (cM) are listed between the markers. Segregation patterns for each population are denoted by the shading of bars.

 


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  		Fig. 2. Distribution of mean brown stem rot (BSR) disease reactions (A) across two field locations and (B) in the greenhouse for a population of F4–derived soybean lines developed by crossing the cultivars Bell and Colfax. Genotypes of lines for Satt547 are designated by the shading of bars. BSR symptoms were a visual estimation of the proportion of stem pith tissue that was browned. The BSR disease scores for the parents are designated by the placement of their names on the figure.

 


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  		Fig. 3. Plots of likelihood of odds (LOD) scores for mapping quantitative trait loci (QTL) on linkage group J for brown stem rot (BSR) resistance in a population of F4–derived lines developed from a cross between the soybean cultivars Bell and Colfax. The phenotypic data are based on the average stem browning in a greenhouse test (Urbana, IL) and across field tests in LaSalle, IL, and Madison, WI. Distances in centimorgans (cM) are indicated on the x axis.

 




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