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Molecular Characterization of Slow Leaf-Rusting Resistance in Wheat

^a Dep. of Plant and Soil Sciences, Oklahoma State Univ., Stillwater, OK 74078
^b USDA-ARS, Plant Science and Entomology Research Unit and Dep. of Agronomy, Kansas State Univ., Manhattan, KS 66506
^c Dep. of Botany and Plant Pathology, Purdue Univ., West Lafayette, IN 47907
^d Dep. of Entomology and Plant Pathology, Oklahoma State Univ., Stillwater, OK 74078

View larger version (42K): [in this window] [in a new window]   Fig. 1. Frequency distributions for AUDPC (A), FS (B), IR (C), and ID (D) measured across two experiments for 104 RILs derived from CI 13227 x Suwon 92 and their parents.

View larger version (19K): [in this window] [in a new window]   Fig. 2. Likelihood plots of the QTL QLr.osu-2B for AUDPC (solid curves), final severity (bold curves), and infection rate (dotted curves) measured in 1994 (A) and 1995 (B). The vertical line shows the LOD value of 3.0. The number under the horizontal line represents the highest LOD value.

View larger version (24K): [in this window] [in a new window]   Fig. 3. Likelihood plots of the QTL QLr.osu-7BL for AUDPC (solid curves), final severity (bold curves), and infection rate (dotted curves) in 1994 (A) and 1995 (B). The vertical line shows the LOD value of 3.0. The number under the horizontal line represents the highest LOD value.

View larger version (21K): [in this window] [in a new window]   Fig. 4. Likelihood plots of a QTL for leaf rust infection duration in 1994 (solid curve) and 1995 (dot curve). The vertical line shows the LOD value of 3.0. The number under the horizontal line represents the highest LOD value.