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AFLP and AFLP-Derived SCAR Markers Associated with Striga gesnerioides Resistance in Cowpea

O. Boukara, L. Konga, B. B. Singhc, L. Murdockb and H. W. Ohma,*

a Agronomy Dep., Purdue Univ., West Lafayette, IN 47907
b Entomology Dep., Purdue Univ., West Lafayette, IN 47907
c International Institute of Tropical Agriculture, Sabo Bakin Zuwo Road, PMB 3112, Kano, Nigeria



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  		Fig. 1. Amplified fragment length polymorphism pattern on polyacrylamide gels around the polymorphic products (arrow) obtained by primer combinations E-ACT/M-CAC. M, Pr, Ps, Br, Bs, R, and S represent DNA ladder, resistant parent, susceptible parent, resistant bulk, susceptible bulk, and resistant and susceptible individual F2 plants, respectively.

 


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  		Fig. 2. Map showing amplified fragment length polymorphism markers associated with the S. gesnerioides resistance gene Rsg1. The map distances are displayed in centimorgans at the left side for (A) population IT93K-693-2 x IAR1696 and (B) IT93K-693-2 x ‘Kamboinse local’.

 


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  		Fig. 3. Metaphor agarose gel (BMA, Rockland, ME) showing the results of polymerase chain reaction amplifications based on the use of the sequence characterized amplified region marker converted from E-ACT/M-CAC115. M, Ps, Pr, Br, Bs, R, H, and S represent 20-bp ladder, susceptible parent, resistant parent, resistant bulk, susceptible bulk, and resistant, heterozygous, and susceptible individuals, respectively, from the population IT93K-693-2 x IAR1696.

 




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