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Identification, Mapping, and Confirmation of a Soybean Gene for Bud Blight Resistance

^a Univ. of Georgia, Center for Applied Genetic Technologies, 111 Riverbend Road, Athens, GA 30602-6810
^b Pioneer Hi-Bred Int., Crop Genetics Res. and Dev., 19456 St. Hwy 22, Mankato, MN 56001
^c Pioneer Hi-Bred Int., 7300 NW 62nd Avenue, P.O. Box 1004, Johnston, IA 50131
^d Dep. of Plant Pathology, Univ. of Georgia, Georgia Exp. Stn., 1109 Experiment Street, Griffin, GA 30223

View larger version (15K): [in a new window]   Fig. 1. Distribution of 116 F4:7 soybean lines of the mapping population of ‘Young’ x PI 416937 for bud blight rating (Rating: 0 = no plants exhibiting bud blight symptoms to 6 = 6 or more plants exhibiting terminal bud death).

View larger version (12K): [in a new window]   Fig. 2. QTL-likelihood plot for bud blight on Linkage Group F for the F4:7 soybean lines of ‘Young’ x PI 416937 based on composite interval mapping. The significance threshold is indicated by a line at LOD = 2.5.

View larger version (20K): [in a new window]   Fig. 3. Distribution of 180 F2:3 soybean lines of the confirmation population of ‘Young’ x PI 416937 for percentage of plants exhibiting bud blight.

View larger version (11K): [in a new window]   Fig. 4. Linkage Group F (LG F) for the Young x PI 416937 F2:3 soybean population showing the five SSR markers and their distance in cM. Location of RFLP marker K644_1 is approximated based on Cregan et al. (1999).

View larger version (30K): [in a new window]   Fig. 5. Mean incidence of bud blight in 180 F2:3 soybean lines homozygous for the ‘Young’ (Y/Y) band, homozygous for the PI 416937 (PI/PI) band, and heterozygous (Y/PI) for bands at Satt510.