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Estimating yield depression caused by nonuniformity of spatial plant patterns

Manfred Hühn*

Inst. of Crop Science and Plant Breeding, Christian-Albrechts Univ., Am Botanischen Garten 1-9, D-24118 Kiel, Germany



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  		Fig. 1. Irregular spatial pattern of rapeseed plants and resulting Thiessen polygons used to estimate yield depression.

 


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  		Fig. 2. Linear regression of inverse of single plant yield on inverse of individual area per plant for the rapeseed data set used to estimate yield depression.

 




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Environmental Quality		 The Plant Genome
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