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Biplot Analysis of Diallel Data

Weikai Yan* and L. A. Hunt

Crop Science Division, Dep. of Plant Agriculture, Univ. of Guelph, Guelph, ON, Canada N1G 2W1



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Fig. 1. Biplot based on diallel data of seven wheat genotypes with varying resistance to Fusarium head blight; (A) average tester ordination view, (B) polygon view. Codes of the genotypes are: A = Alidos, B = 81-F3-79, C = Arina, D = SVP-72017-17-5-10, E = SVP-C8718-5, F = UNG-136.1, and G = UNG-226.1. Genotypes are labeled with upper-case letters when viewed as entries and with lower-case letters when viewed as testers. Exact positions of the entries and testers are at the beginning of the labels. The circle indicates the average tester.

 


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Fig. 2. Biplot based on diallel data of six wheat genotypes with varying resistance to Stagonospora nodorum blotch; (A) average tester ordination view, (B) polygon view. Codes of the genotypes are: A = 18NT, B = Coker9543, C = Coker9803, D = L890682, E = TX82-11, and F = TX92D7374. Genotypes are labeled with upper-case letters when viewed as entries and with lower-case letters when viewed as testers. Exact positions of the entries and testers are at the beginning of the labels. The circle indicates the average tester.

 


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Fig. 3. Biplot based on diallel data of 10 corn inbreds with varying resistance to pink stem borer; (A) average tester ordination view, (B) polygon view. Codes of the genotypes are: A = A509; B = A637; C = A661; D = CM105; E = EP28; F = EP31; G = EP42; H = F7; I = PB60; and J = Z77016. Genotypes are labeled with upper-case letters when viewed as entries and with lower-case letters when viewed as testers. Exact positions of the entries and testers are at the beginning of the labels. The circle indicates the average tester.

 





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