HOME HELP FEEDBACK SUBSCRIPTIONS ARCHIVE SEARCH TABLE OF CONTENTS		QUICK SEARCH:   [advanced] Author: Keyword(s): Year:  Vol:  Page:

This Article Abstract Full Text Free Full Text (PDF) Free Alert me when this article is cited Alert me if a correction is posted Services Similar articles in this journal Similar articles in ISI Web of Science Alert me to new issues of the journal Download to citation manager Citing Articles Citing Articles via HighWire Citing Articles via ISI Web of Science (38) Citing Articles via Google Scholar Google Scholar Articles by Singh, R.P. Articles by Sorrells, M.E. Search for Related Content PubMed Articles by Singh, R.P. Articles by Sorrells, M.E. Agricola Articles by Singh, R.P. Articles by Sorrells, M.E.

Mapping Yr28 and Other Genes for Resistance to Stripe Rust in Wheat

^a Wheat Program, International Maize and Wheat Improvement Center (CIMMYT), Apdo. Postal 6-641, 06600 Mexico, D. F., Mexico
^b 49 Lionel Rd., Darlington WA 6070, Australia
^c Dep. of Plant Breeding and Biometry, 252 Emerson Hall, Cornell Univ., Ithaca, NY 14853, USA

View larger version (40K): [in a new window]   Fig. 1 Infection type (IT) distribution of Synthetic/Opata wheat recombinant inbred lines tested with two pathotypes of P. striiformis. The bars labeled "Cumul[ative]" R and S are inserted to illustrate the 3:1 and 1:1 segregation ratios for the pooled resistant vs. susceptible line classes

View larger version (16K): [in a new window]   Fig. 2 Chi-square contingency-test contours for seedling stripe rust IT scored as a binary (R, S) trait in Synthetic/Opata wheat RILs. Key to plot labels: 1 4E14_RS, response to race 14E14 at standard temperatures; Yr28, Yr18', resistance responses of these assigned genes to challenge with race MEX96-11. Markers are arrayed in map order with short arms of chromosomes at right. Chromosome lengths reflect numbers of markers, not genetic length

View larger version (22K): [in a new window]   Fig. 3 Contours showing LOD for simple regression of seedling IT in Synthetic/Opata wheat RILs on each RFLP marker in turn, after removal of resistant lines carrying the Synthetic allele at RFLP marker Xmwg634-4DS, and chi-square contingency test for the same trait coded as binary (R, S). Markers are arrayed in map order with short arms of chromosomes at right. Chromosome lengths reflect numbers of markers, not genetic length. In the upper (LOD) plot, deviation from center line at a marker indicates the parent contributing the allele associated with higher disease

View larger version (16K): [in a new window]   Fig. 4 Distribution of Synthetic x Opata wheat RILs for field stripe rust severity at two locations. Severity scores are based on the modified Cobb scale (Peterson et al., 1948)

View larger version (26K): [in a new window]   Fig. 5 LOD contours for simple regression of field stripe rust severity in Synthetic/Opata wheat RILs on each RFLP marker in turn. Markers are arrayed in map order with short arms of chromosomes at right. Chromosome lengths reflect numbers of markers, not genetic length. Deviation from center line at a marker indicates the parent contributing the allele associated with higher disease

View larger version (40K): [in a new window]   Fig. 6 Interval regression LOD contours for adult-plant stripe-rust resistance associated with four chromosome arms in Synthetic/Opata wheat RILs