Genotype x Environment Interactions in Maize Hybrids from Temperate or Highland Tropical Origin
C. Giauffreta,
J. Lothropb,
D. Dorvilleza,
B. Gouesnardc and
M. Derieuxa
a Unité de génétique et d'amélioration des plantes, Institut National de la Recherche Agronomique, Domaine Brunehaut, F-80200 Estrées-Mons, France
b Cargill Hybrid Seeds, P.O. Box 701, Kaunakakai, HI 96748 USA
c Unité de génétique et d'amélioration des plantes, Institut National de la Recherche Agronomique, Domaine de Melgueil, F-34130 Mauguio, France

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Fig. 1 Relationship between mean grain yield over four environments and percentage of total hybrid x location sum of squares, a measure of yield stability
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Fig. 2 (a) Rust susceptibility and mean grain yield of 41 maize hybrids and two commercial checks in two tropical highland environments, 1993. Disease rating scale 1 to 5, where 1 = highly resistant and 5 = highly susceptible. (b) Smut susceptibility and mean grain yield of 41 maize hybrids and two commercial checks in two temperate environments, 1993. Disease rating scale 0 to 3, where 0 = no symptoms and 3 = all plants with symptoms on the ear and on the stem
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Fig. 3 (a) Planting-to-silking duration and mean grain yield of 41 maize hybrids and two commercial checks in two tropical highland environments, 1993. (b) Planting-to-silking duration and mean grain yield of 41 maize hybrids and two commercial checks in two temperate environments, 1993
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Fig. 4 Partitioning of the hybrid x location interaction sum of squares for grain yield. The partitioning is based on a covariate effect. The covariates are the interaction parameters estimated for different traits (see abbreviations in Table 1). The first interaction term with the covariate to be introduced was the one that explained the highest amount of the variation
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Fig. 5 Relationship and regression coefficients (b) between grain yield interaction parameter estimates and interaction parameter estimates for (a) planting-to-silking duration, (b) ear height, and (c) planting-to-emergence duration
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Copyright © 2000 by the Crop Science Society of America.