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Quantitative Trait Loci for Antibiosis Resistance to Corn Earworm in Soybean

^a USDA ARS, Insect Biology and Population Management Research Lab, P.O. Box 748, Tifton, GA 31793 USA
^b Dep. of Entomology, Univ. of Georgia, Athens, GA 30602-2603 USA
^c Dep. of Crop and Soil Sciences, Univ. of Georgia, Athens, GA 30602-7272 USA

View larger version (30K): [in a new window]   Fig. 1 Distribution of F2-derived lines of the crosses Cobb x PI171451, Cobb x PI227687, and Cobb x PI229358 based on mean larval weight gain of corn earworm fed on these lines

View larger version (25K): [in a new window]   Fig. 2 Confidence intervals for corn earworm weight gain resistance QTLs in three soybean crosses. The large, shaded bars represent soybean linkage groups with LG designations adapted from the integrated soybean restriction fragment length polymorphism (RFLP)/simple sequence repeat (SSR) map (Cregan et al., 1999). RFLP markers in normal typeface are included from that map as evenly spaced reference points. RFLP markers listed in boldface are those that were found closest to the quantitative trait loci logarithm of the odds peak(s) and are specific to the maps constructed for this study. Vertical lines to the left of each linkage group approximate the portion(s) of each linkage group