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Published in Crop Sci 7:271 (1967)
© 1967 Crop Science Society of America
677 S. Segoe Rd., Madison, WI 53711 USA
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A Positive Regression of Yield on Maturity in Sorghum1

L. G. Dalton2

A positive regression between high yields and late maturity is demonstrated for grain sorghum. This regression should be considered when hybrid performance is tested. The use of this high yield-late maturity relationship should assist in the detection of the more productive hybrids at all levels of maturity.

1 Contribution from Pioneer Sorghum Company.

2 Plant Breeder, Pioneer Sorghum Company, Box 788, Plainview, Texas.

Received for publication June 27, 1966.




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The SCI Journals Agronomy Journal Vadose Zone Journal
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Journal of Natural Resources
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Copyright © 1967 by the Crop Science Society of America.