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Analysis of Two Diallel Sets of Sweet Corn Inbreds for Corn Earworm Injury¹

A diallel set involving five inbred lines of sweet corn was evaluated for earworm injury at Lafayette, Indiana. The two most resistant lines produced the most resistant F₁ progenies. However, the most susceptible line did not produce the most susceptible progenies.

Diallel analysis of a six-line set of sweet corn inbreds for corn earworm injury at Tifton, Georgia, indicated significant levels of general and specific combining abilities in the F₁ progenies. Of the lines studied, Ml 19 gave the poorest fit to a model assuming only additive and dominance genetic effects, as determined by regression of array covariance on array variance. Evidence for an excess of dominant alleles was indicated, with the suggested mean level of dominance being in the complete dominance range. Minimal estimates of gene number in excess of three make simple inheritance of earworm resistance improbable.

Maternal and reciprocal effects were not detected at either location. The extension and tightness of husks appeared to be quite important in determining earworm resistance at Lafayette.

² Research Geneticist, Crops Research Division, and Research Entomologist, Entomology Research Division, ARS, USDA, Tifton, Ga.

Received for publication July 5, 1966.