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a Dep. of Soil and Crop Sciences, Colorado State Univ., Fort Collins, CO 80523-1170
b Dep. of Bioagricultural Sciences and Pest Management, Colorado State Univ., Fort Collins, CO 80523-1177
c North Dakota State Univ., Carrington, ND 58421
* Corresponding author (Mark.Brick{at}ColoState.Edu).
White mold disease (WM) of common bean (Phaseolus vulgaris L.), caused by Sclerotinia sclerotiorum (Lib.) de Bary, reduces crop yield and quality throughout the United States. The development of cultivars with resistance to WM would be facilitated by the identification and use of molecular markers linked to resistance genes. The objectives of this research were (i) to characterize WM reaction in a recombinant inbred line (RIL) population derived from a cross between resistant and susceptible germplasm, (ii) to validate the effect of a previously reported quantitative trait locus (QTL) for WM resistance, and (iii) to locate additional QTL associated with WM resistance. A RIL population that consisted of 94 lines was derived from a cross between G122 (resistant) and CO72548 (susceptible). The population was evaluated for WM reaction in three greenhouse tests and one field environment, and for molecular markers throughout the genome. Two RIL were identified with higher resistance levels (P < 0.05) than the resistant parent G122. A previously reported QTL on linkage group B7 was significant (P < 0.01) in single-factor analysis of variance, but not with composite interval mapping. Five QTL for resistance to WM were found (likelihood odds ratio [LOD] > 2.7) on linkage groups B1, B2b, B8, and B9. The QTL were contributed from both parents and together accounted for 48% of the phenotypic variation (R2). For field resistance, one QTL (R2 = 12%) on linkage group B8 was detected. These results confirm polygenic resistance to WM in common bean.
Abbreviations: AFLP, amplified fragment length polymorphism ASI, average severity index bp, base pair CIM, composite interval mapping CSU, Colorado State University DI, disease incidence DS, disease severity LOD, likelihood odds ratio NDSU, North Dakota State University PCR, polymerase chain reaction QTL, quantitative trait locus(i) RAPD, random amplified polymorphic DNA RFLP, restriction fragment length polymorphism RIL, recombinant inbred line(s) SCAR, sequence characterized amplified region SFA, Single factor analysis SSR, simple sequence repeat WM, white mold disease
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