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Dep. of Agronomy, IAV Hassan II, BP6202 Rabat/Instituts, Morocco
Dep. of Agronomy
USDA-ARS, Dep. of Entomology
Dep. of Agronomy, Purdue Univ., West Lafayette, IN 47907
* Corresponding author.
The expression of resistance of wheat (Triticum spp.) to the Hessian fly (Mayetiola destructor Say) is affected by cultivar, biotype, and temperature. The objectives of this study were to: (i) evaluate the resistance of seven durum wheat (T. durum desf.) and four common wheat (T. aestivum L.) introductions, and three wheat checks to biotypes B, D, and L of Hessian fly , and (ii) examine their expressions of resistance to biotype D at three temperatures. Tests against the three biotypes were conducted in a greenhouse at 19 ± 2 °C; temperature experiments were conducted in controlled environment chambers at 19, 23, and 26 ± 2 °C. In all experiments, 30 seeds of each wheat line were planted in a row in a 54 x 36 x 8 cm wooden flat filled with a greenhouse soil mixture. Twenty-one days after infestation, the seedlings were classified as resistant or susceptible. The 11 wheat introductions were resistant to biotypes B, D, and L under greenhouse conditions. Nearly all seedlings of the durum lines Portugal 2536, Portugal 2852, Rebeiro, BD 3431 and IN 8464(H5H5) were resistant at 19, 23, and 26 °C. Fewer seedlings of the durum lines BD 3414, BD 3885, and PI 422297; and of the common wheat lines PI 86202, PI 117499, PI 134867, PI 321644, and Abe(H5H5) were resistant at temperatures > 19 °C. Resistance conferred by the H5 gene was expressed in a greater percentage of seedlings of IN 8464 than Abe, especially at temperatures > 19 °C. These results are of practical importance to wheat breeders in tropical or subtropical regions of the world where Hessian fly is a serious pest of wheat.
Received for publication July 11, 1988.
This article has been cited by other articles:
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R. H. Ratcliffe, F. L. Patterson, S. E. Cambron, and H. W. Ohm Resistance in Durum Wheat Sources to Hessian Fly (Diptera: Cecidomyiidae) Populations in Eastern USA Crop Sci., July 1, 2002; 42(4): 1350 - 1356. [Abstract] [Full Text] [PDF] |
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