Crop Science Journal of Natural Resources and Life Sciences Education
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Published in Crop Sci 27:895-898 (1987)
© 1987 Crop Science Society of America
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A Soybean Genotype Resistant Resistant to Phomopsis Seed Decay1

E. A. Brown, H. C. Minor and O. H. Calvert2

Phomopsis seed decay (PSD) reduces soybean [Glyclne max (L.) Merr.| seed quality and seedling establishment. Experiments were conducted in Columbia, MO, and Isabela, PR, over a 3-yr period to identify a source(s) of resistance to PSD in soybean. All genotypes evaluated were field grown under conditions favorable for infection by Phomopsis spp. Percentage infection was determined by counting colonies of Phomopsis spp. growing from surface-sterilized seeds plated on acidified potato (Solanum spp.) dextrose agar. Plant introduction (PI) 417479 was free of Phomopsis spp. seed infection at Columbia in 1984 and Isabela in 1985, and had 3% infection at Columbia in 1985. A phenotypically indistinguishable genotype, PI 360841, had levels of infection that did not differ statistically from those observed for PI 417479 and may be a duplicate in the germplasm collection. In the same environments, the widely grown ‘Williams 82’ showed from 25 to 59% infection. The PI 417479 exhibited less infection than the reported P. sojae Lehman resistant genotypes PI 80837 and ‘Delmar’ in all but one test. Maturity dates of PI 417479 were near the average of all genotypes tested. The PI 417479 appears to have been exposed to average, or above average, disease pressure. Thus, the level of resistance to PSD measured cannot be attributed to maturation during periods of favorable environmental conditions. Also, antagonism of Phomopsis spp. seed infection by Cercospora kikuchii (T. Matsu. & Tomoyasu) Gardner did not appear to influence the conclusions relative to PI 417479. Detectable seed infection of PI 417479 by C. kikuchii was 2% or less in all experiments.

Key Words: Glycine max (L.) Merr. • Diaporthe spp. • Phomopsis spp. • Seed quality • PI 417479 • PI 360841


1 Contribution from the Missouri Agric. Exp. Stn., Columbia, MO 65211. Journal Series no. 10016. Research supported in part by a gift from the Missouri Seed Improvement Association.

2 Former graduate research assistant (currently soybean pathologist, J. Hartz Seed Co., Stuttgart, AR) and associate professor, Dep. of Agronomy, and professor, Dep. of Plant Pathology, Univ. of Missouri, Columbia, MO 65211, respectively.

Received for publication June 17, 1986.


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E. W. Jackson, P. Fenn, and P. Chen
Inheritance of Resistance to Purple Seed Stain Caused by Cercospora kikuchii in PI 80837 Soybean
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E. W. Jackson, P. Fenn, and P. Chen
Inheritance of Resistance to Phomopsis Seed Decay in Soybean PI 80837 and MO/PSD-0259 (PI 562694)
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