Crop Science Journal of Natural Resources and Life Sciences Education
HOME HELP FEEDBACK SUBSCRIPTIONS ARCHIVE SEARCH TABLE OF CONTENTS
 QUICK SEARCH:   [advanced]


     


Published in Crop Sci 27:759-765 (1987)
© 1987 Crop Science Society of America
677 S. Segoe Rd., Madison, WI 53711 USA
This Article
Right arrow Full Text (PDF)
Right arrow Alert me when this article is cited
Right arrow Alert me if a correction is posted
Services
Right arrow Similar articles in this journal
Right arrow Alert me to new issues of the journal
Right arrow Download to citation manager
Right arrow reprints & permissions
Citing Articles
Right arrow Citing Articles via HighWire
Right arrow Citing Articles via Google Scholar
Google Scholar
Right arrow Articles by Vaughan, D. A.
Right arrow Articles by Kunwar, I. K.
Right arrow Search for Related Content
PubMed
Right arrow Articles by Vaughan, D. A.
Right arrow Articles by Kunwar, I. K.
Agricola
Right arrow Articles by Vaughan, D. A.
Right arrow Articles by Kunwar, I. K.

Soybean Seed Coat Development1

Duncan A. Vaughan, R. L. Bernard, J. B. Sinclair and Indra K. Kunwar2

The seed coat of mature soybean [Glycine max (L.) Merr.I has natural openings the micropyle and pits (pores). To determine when pits appeared during development of the seed coal scanning electron microscopic studies were made at weekly intervals after pollination. Pits appeared in the two accessions studied at about growth stage R7 (beginning maturity), 7 to 14 days before R8 (full maturity). micropyle developed before pollination and usually was an open structure. However, in ‘Union’, a micropylar plug was observed at 3 weeks after pollination. The micropyle was a well defined natural opening in the seedcoat from before pollination to maturity, whereas seed coat pits only began to form as the seed began to desiccate.

Key Words: Glycine max (L.) Merr. • Scanning electron microscopy • Seed quality • Seed anatomy • Seed pathology


1 Cooperative investigations by the USDA-ARS and the Illinois Agric. Exp. Stn.

2 Graduate research assistant; research geneticist, USDA-ARS, and professor, Dep. of Agronomy; professor; and former visiting research associate, Dep. of Plant Pathology, Univ. of Illinois at Urbana-Champaign, Urbana, IL 61801. Present address of D.A. Vaughan is Int. Rice Res. Inst., P.O. Box 933, Manila, Philippines 2801 and I.K. Kunwar is c/o A.C. Kunwar, Directors Res. Group, Regional Res. Lab., Hyderabad, India 500007.

Received for publication August 20, 1986.


This article has been cited by other articles:


Home page
ANN BOT (LOND)Home page
F. MA, E. CHOLEWA, T. MOHAMED, C. A. PETERSON, and M. GIJZEN
Cracks in the Palisade Cuticle of Soybean Seed Coats Correlate with their Permeability to Water
Ann. Bot., August 1, 2004; 94(2): 213 - 228.
[Abstract] [Full Text] [PDF]




HOME HELP FEEDBACK SUBSCRIPTIONS ARCHIVE SEARCH TABLE OF CONTENTS
The SCI Journals Agronomy Journal Vadose Zone Journal
Journal of Natural Resources
and Life Sciences Education
Soil Science Society of America Journal
Journal of Plant Registrations Journal of
Environmental Quality
The Plant Genome
Copyright © 1987 by the Crop Science Society of America.