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Published in Crop Sci 23:54-56 (1983)
© 1983 Crop Science Society of America
677 S. Segoe Rd., Madison, WI 53711 USA
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Heritability of Sugarcane Smut Resistance and Correlation Between Smut Grade and Yield Components1

K. K. Wu, D. J. Heinz and H. K. Meyer2

This study was conducted to estimate the heritability of sugarcane (Saccharum sp.) smut (Ustilago scitaminea Syd.) resistance and to evaluate the association between smut grades and sugarcane agronomic traits. The progenies of diallel crosses involving four highly smut-susceptible and four highly smut-resistant Hawaiian commercial sugarcane clones were used. Heritability in the narrow sense was estimated at 0.56 on the basis of individual smut grades. The heritability of this breeding population might have been overestimated because the eight parents used in this study represented two extreme smut infection groups. Nevertheless, a fairly rapid response to selection for smut resistance can be expected. There were no correlations between smut grade and stalk diameter, stalk number, or plant volume. Correlation coefficients between smut grade and stalk length and refractometer solids were about 0.1. Since all correlations were low, there should be no difficulty in selecting smut-resistant, highyielding clones.

Key Words: Saccharum spp. • Ustilago scitaminea Syd. • Diallel cross • General combining ability • Specific combining ability

1 Published with the approval of the Director as Paper No. 533 in the Journal Series of the Experiment Station, Hawaiian Sugar Planters' Assoc. Research supported in part with funds provided by the USDA-ARS Cooperative Agreement No. 58-9AHZ-9-401.

2 Associate plant breeder, director, and associate plant breeder, respectively, Exp. Stn., Hawaiian Sugar Planters' Assoc., Aiea, Hawaii 96701

Received for publication February 2, 1982.




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