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Genetics of Host Plant Resistance of Wheat to Septoria nodorum¹

F₁ progeny from diallel crosses (reciprocals included) among five wheat (Triticum aestivum L.) cultivars were tested in the greenhouse for reaction to infection by Leptosphaeria nodorum Muller [imperfect stage = Septoria nodorum (Berk.) Berk.], the cause of glume blotch. In a separate experiment, four wheat parents and all F₁, F₂, and backcrosses were likewise tested for reaction to the pathogen. Significant effects were found for additive, dominance, and additive x additive genetic effects as well as heterosis. Cultivars with the additive type resistance were ‘Oasis’ and ‘Blueboy II’ in Exp. I and Oasis in Exp. II. Crosses involving ‘McNalr 1813’, a susceptible parent, demonstrated heterosis for a more resistant reaction. These results indicate that resistance to S. nodorura is inherited in a very complex manner and that several genes may be involved.

Key Words: Diallel cross • Additive gene action • Dominance • Epistasis • Heterosis • Glume blotch • Triticum aestivum L.

² Associate professor, Texas A&M Univ. Agric. Res. & Ext. Ctr., Overton and Professor, Dep. Plant Sci., Texas A&M Univ., College Station, TX 77843.

Received for publication April 27, 1981.

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