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Published in Crop Sci 18:765-769 (1978)
© 1978 Crop Science Society of America
677 S. Segoe Rd., Madison, WI 53711 USA
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Grain Yield Variations in Oats Associated with Differences in Leaf Area Duration Among Oat Lines1

Diana Bloethe Helsel and Kenneth J. Frey2

Growth and yield component analyses were used to attempt to define the source of grain yield increases (27 to 30% above the cultivar ‘Clintford’) found in oat (Avena sativa L.) lines developed through introgression of Avena sterilis L. germplasm into the Clintford background. Leaf area and leaf area duration were found to be the two traits that could account for the higher yielding ability of the derived lines. By developing a larger leaf-blade area and delaying senescence, the cultivars had the potential to produce more photosynthate than Clintford. Early development of greater leaf-blade area probably caused the initiation of a larger number of spikelets per panicle, and the maintenance of a large photosynthetically active system longer after flowering could have caused the development of larger kernels. Higher yield of the derived lines was due to more spikelets per panicle and increased kernel weight. Apparently, the A. sterilis germplasm contributed genes for enhanced leaf growth and delayed senescence which, inserted into the Clintford background, resulted in lines with higher grain yields.

Key Words: Avena sativaA. sterilis • Growth analysis • Growth rate (GR) • Net assimilation rate (NAR)


1 Journal Paper No. J-9045 from the Iowa Agric. and Home Economics Exp. Stn., Ames, IA 50011. Project 1752.

2 Graduate research associate in agronomy and C. F. Curtiss Distinguished Professor in Agriculture.

Received for publication December 23, 1977.


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