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Comparison of Early Generation Yield Testing and a Single Seed Descent Procedure in Wheat Breeding

Two breeding procedures were compared in two spring wheat (Triticum aestivum L. em. Thell.) crosses. Both procedures were started from the same selected F₂ plants in each cross. In one procedure, a single seed was taken from each F₂ plant to produce the F₃ generation, the process was repeated for the F₄. The F₅ lines were then produced from the seed of individual F₄ plants (single seed descent method, SSD). In the second procedure, the F₃ lines were yield-tested and a pedigree method followed in the F₃ and F₄ (YT method). Each F₄ line was bulked to provide seed for a yield test in the F₅. The F₆ SSD lines and F₅ YT lines were then compared in yield tests.

The mean yield of the YT lines was significantly higher in both crosses, mainly because there were fewer, very low yielding YT lines. The correlations between the F₃ and F₅ yields of the YT lines were significant in both crosses, but were not particularly large (0.29 and 0.14). The yield of the F₅ YT lines, derived from the highest yielding 20% of the F₃ lines, was compared with the highest-yielding 20% of the Fo SSD lines. In each cross, the SSD lines were at least as good as the YT lines. Although selection based on F₃ yields would have had some effect, it is doubtful that it was worth the labor involved. The SSD procedure appears to have considerable merit

Key Words: Pedigree method • Selection

Received for publication June 12, 1974.

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