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We found a high correlation between predicted (as calculated from single cross data) and observed maize dwarf mosaic (MDM) ratings for 15 double crosses of corn (Zea mays L.). Predicted and observed grain yields were also highly correlated. Predicted MDM ratings for double crosses were negativdy correlated with predicted grain yields for double crosses, but the correlation coefficient was not as large between the observed MDM double-cross ratings and observed grain yield for double crosses. In general, a nearly linear response in increased MDM rating values was observed both for the predicted and observed double-cross performances with each additional substitution of a susceptible inbred parent for a tolerant one. Estimates of gca mean squares were nearly 40-fold the sca value for MDM ratings; for grain yield the ratio was about 6-fold. For the eight inbred lines we used in this study and under the levels of MDM infection encountered, our results suggest that tolerance to MDM may be conditioned by a few major genes in association with a modifier gene complex or by many genes with small additive effects.
Key Words: Host-plant resistance Corn breeding Plant pathology Inheritance
2 Research Agronomist, ARS, USDA, and Professor of Agronomy; Experiment Station Statistician, University of Missouri, Research Geneticist, ARS, USDA, and Associate Professor of Agronomy, Assistant Professor of Entomology, University of Missouri, Columbia, Mo. 65201.
Received for publication May 18, 1972.
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