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Heterosis, Inbreeding Depression, and Heritability Estimates in a Systematic Series of Grain Sorghum Genotypes¹

Ten genetic sets of grain sorghum (Sorghum bicolor L. Moench) each consisting of two pure lines, their F₁, F₂, and first backcrosses were studied at two locations in two years. Of characteristics observed, grain yield showed the highest heterosis [(F₁—better parent)(100)/better parent] as averaged over the 10 sets and likewise had the greatest inbreeding depression [(F₁—F₂) (100)/F₁]. Heterosis was low for plant height and negative for days-to-first-bloom and kernel weight. Narrow sense heritability estimates, for the F₂ generation, varied among sets. The estimates for days-to-first-bloom, plant height, and kernel weight were relatively high. In contrast, grain yield had low heritability. Expected genetic advance in F₃ yield under selection, was higher than actual advance for most sets, suggesting epistasis.

Key Words: Inheritance • Gene effect

² Associate Professor and graduate assistant of Agronomy and Associate Professor of Statistics.

Received for publication December 2, 1970.

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