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Published in Crop Sci 11:190-193 (1971)
© 1971 Crop Science Society of America
677 S. Segoe Rd., Madison, WI 53711 USA
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Relationships Between Yield and Its Components and Structures Above the Flag Leaf Node in Spring Wheat1

P. Hsu and P. D. Walton2

The relationship of yield in spring wheat (Triticum aestivum) with its components and the morphological structures above the flag leaf node which contribute to the photosynthetic area were studied under both field and greenhouse conditions. Five varieties, with the F1, F2, and backcross progenies of a complete diallel set of crosses between them, were considered. Ear length, flag leaf sheath length and flag leaf breadth influenced yield and its components significantly. Ear number per plant was the most important component in determining yield per plant.

Key Words: Correlations • Diallel crosses • Canadian wheat • Triticum aestivum • Regressions • Factor analysis


1 Contribution from the Plant Science Department, University of Alberta, Edmonton, Alberta, Canada. Supported by National Research Council of Canada Grant No. A5452.

2 Graduate student and Professor, Plant Science Department, University of Alberta, Edmonton, Alberta, Canada.

Received for publication February 7, 1970.





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