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Published in Crop Sci 11:75-77 (1971)
© 1971 Crop Science Society of America
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Test Weight in High-Amylose Corn1

J. L. Helm, A. V. Paez, P. J. Loesch, Jr. and M. S. Zuber2

Inheritance of grain test weight in high-amylose corn (Zea mays L.) was studied by measuring the test weight performance of several inbred lines crossed on two singlecross testers and by a diallel mating system. Wider ranges in test weight were obtained with the low test-weight tester than with the higher test-weight tester. Rankings of entries for test weight were (1) highly correlated between years, (2) intermediate between locations, and (3) low between testers. The diallel analysis indicated a preponderance of additive genetic effects. Single-cross hybrids involving inbred parents with low test weights had lower test weights than hybrids from Low by High and High by High inbred parents, with the latter group having the highest test weights. Likewise, inbred parents with low test weights gave lower top cross test weight performance than inbreds with higher test weights. Low test-weight single-cross testers had lower average test weights than testers with higher test weights. Breeding methods which take advantage of the large additive effects should be suitable in improving test weight of high-amylose corn

Key Words: Kernal density • Top cross • Diallel cross

1 Joint contribution from Anheuser-Busch, Inc., St. Louis, Missouri; Department of Agronomy, Missouri Agricultural Experiment Station Journal Series No. 5984; and Crops Research Division, Agricultural Research Service, U. S. Department of Agriculture.

2 Geneticist, Anheuser-Busch, Inc., St. Louis, Missouri, 63118; Graduate Assistant (now Plant Breeder, Pioneer Hi-Bred Corn Co.), University of Missouri; Research Geneticist and Research Agronomist, Crops Research Division, ARS, USDA, and Assistant Professor and Professor of Agronomy, University of Missouri, Columbia, Missouri 65201, respectively.

Received for publication July 8, 1970.




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